Broadcom

0:07 Let's address an overstated concern. LED 0:10 degradation in optoouplers. But is it 0:13 really something to worry about? With 0:15 Broadcom optoouplers, LED reliability 0:18 isn't a problem. Built on decades of 0:21 innovation, Broadcom's high reliability 0:23 LED technology is designed to minimize 0:26 degradation and maximize lifespan. 0:29 For over 50 years, Broadcom has refined 0:32 its manufacturing processes, minimizing 0:34 LED defects. Continuous improvements in 0:37 materials, manufacturing, and screening 0:40 ensure long-term reliability and prevent 0:42 early failures. High brightness 0:44 materials improve light extraction and 0:46 optimize designs reduce energy 0:48 consumption. minimize heat and enhance 0:51 LED longevity, delivering better 0:53 performance over time. That's why 0:55 Broadcom optoouplers are trusted in 0:57 industrial, automotive, aerospace, and 1:00 other high reliability applications 1:02 where longevity is critical. In highly 1:05 accelerated life stress tests, 1:07 Broadcom's optoouplers show less than a 1:09 10% drop in current transfer ratio even 1:12 after 1,000 hours of continuous stress. 1:15 This exceptional performance ensures 1:17 reliable operation for over 30 years 1:20 under typical conditions. Built for 1:22 longevity, Broadcom optoouplers deliver 1:25 consistent, dependable performance over 1:27 time. For more insights into optocoupler 1:30 technology, visit www.brocom.com. 1:34 [Music]

0:03 This video will show how the robust 0:06 construction in opto isolator can help 0:08 to mitigate disastrous uncontrolled 0:10 motor movements and galvanic insulation 0:13 damage from power supply failure. 0:17 Opto isolator provides reinforced 0:19 insulation by wide DTI distance through 0:23 insulation with three layers of 0:25 insulation barriers. The DTI of ACPL 0:29 334J gate drive optooupler is.5 mm and 0:34 the insulation barrier of polyomide film 0:36 has a dialectric strength of 300 kov 0:39 volt per millimeter. 0:42 In motor drives the power supply circuit 0:44 must be separated from the pulse width 0:46 modulation PWN control circuit to 0:50 prevent uncontrolled motor movements. 0:53 The lead frame at the ACPL 334J 0:56 is designed with a protective separation 0:59 distance of more than8 mm between the 1:02 power supply and PWM control. Capacitive 1:06 isolator uses silicone dioxide as 1:08 dialectric for the onchip insulation. 1:11 The isolation circuit is integrated on 1:13 the same chip in a monolithic process. 1:16 The thickness of the silicone dioxide or 1:19 DTI is only 0.028 mm as compared to opto 1:23 isolator. 1:25 The construction of a capacitive gate 1:27 driver using isolation does not have a 1:30 protective separation. In a monolithic 1:33 process, the input IC consists of the 1:36 power supply circuit, PWM control 1:38 circuit and silicone dioxide capacitor. 1:42 If there is a malfunction of the power 1:44 supply that damaged the input IC, the 1:47 ability to switch off the motor must be 1:49 guaranteed. ACPL 334J provides a 1:54 protective separation from the 1:55 malfunction power supply. This 1:57 redundancy in architecture provides a 2:00 failsafe condition in which the PWM LED 2:03 will not transmit wrong signal to the 2:05 motor. 2:07 In the single chip architecture of the 2:09 capacitor isolation, the power supply 2:12 malfunction can cause the input logic to 2:14 be in the wrong state, signaling wrong 2:17 motor movements. 2:19 The power supply fault can also damage 2:21 the insulation barrier. A simulation is 2:24 done by increasing the power supply 2:26 voltage with uncontrolled current into 2:29 the input IC. The gate drivers were 2:32 tested at 5,000 volts RMS to detect for 2:35 leakage current according to UL1577. 2:39 The ACPL 334J gate drive shows very low 2:43 leakage current but capacitive fails the 2:45 limit of 5 micro ampere. 2:48 A failure analysis was conducted to see 2:50 the damage to the insulation barrier. 2:53 The power supply has damaged the input 2:55 of ACPL 334J, 2:58 but the polyomide film remains unscathed 3:01 due to wide DTI and three layers of 3:03 insulation. The capacitive gate driver 3:06 exhibits high leakage current because 3:08 the silicone dioxide capacitor is 3:11 damaged. As the insulation is integrated 3:13 on the same chip and a monolithic 3:15 process, their thin DTI cause the 3:18 insulation to fail. This failure will 3:21 lead to electric shock and compromise 3:23 safety.

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0:07 Lighting and other high voltage surges 0:09 are harmful to electronic equipment in a 0:11 home or factory environment. Ile EC6241 0:17 describes the surge environment based on 0:19 the facility location and suggests that 0:22 CAT C can experience 20 kilovolts of 0:25 lightning related surge. Equipment such 0:28 as solar inverters, energy storage 0:30 systems and EV chargers can be found in 0:33 the CAT C location outside and at the 0:36 facility service entrance. 0:38 Isolators like optoouplers, capacitive 0:41 and magnetic couplers are used inside 0:43 this equipment for high voltage 0:45 insulation. 0:47 This video looks into the surge 0:48 withstand capability of these isolators 0:51 by using an electrostatic discharge 0:53 simulator. Broadcom optooupler survives 0:57 a 25 kov volt surge while capacitive and 1:00 magnetic couplers stop functioning above 1:03 14 kovts. Broadcom optoouplers are 1:06 tested with 20 kilovolts pulse 1:08 discharges to achieve UL1577 1:12 double protection certification. Failure 1:15 analysis was conducted to see if the 1:17 surge had damaged the isolation barrier. 1:20 Broadcom optooupler insulation tape 1:22 remains intact. Capacitive and magnetic 1:25 coupler insulation materials of silicon 1:28 dioxide and magnetic coil over polymide 1:31 were damaged. These damages will lead to 1:34 electric shock and compromise safety.